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Accreditatie

FLUXANA® is een geaccrediteerde fabrikant van referentiematerialen volgens DIN EN ISO 17034:2017. Het laboratorium van FLUXANA® werkt volgens DIN EN ISO/IEC 17025:2018.

Accreditatie

2nd Edition

By Dr. RainerSchramm

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The focus of this book is the practical use of XRF.

Newcomers to the technique will find it extremely helpful, but also existing users will be able to expand their knowledge.

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  • Fundemental concepts are explained
  • Important data are listed in handy table form
  • Illustrated, step-by-step sample preparation tips are shown

Many examples of real-life sample preparation problems are detailed and the solution to their successful preparation and analysis, derived from FLUXANA´s unrivalled experience in the XRF technique, are shared with the reader.

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Including a free PDF version of the book.

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Guidelines for XRF analysis

By James Wills, Clive Feather and Ken Turner
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Together, Prof. James Willis, Dr. Clive Featherand Dr. Ken Turner possess 130 years of XRF experience. This book contains alltheir combined knowledge concerning method development.

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Especially the commodity chapters dealing withthe creation of application-dependent measurement programs for WDXRFinstruments should be noted. There are recommendations for selecting elementlines and the associated background positions. Application-dependent scans show possible line overlaps and influencesdue to selection of the analysing crystal and collimator. All importantparameters are addressed and their influences explained for each application.Wherever possible, comparisons to EDXRF are also made.

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"In my opinion, this book is a must for every developer of XRF methods."

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Dr. RainerSchramm

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